Highlights of Laser Testing Capabilities Regarding the Understanding of SEE in SRAM-based FPGA

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Conference papers
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https://hal.archives-ouvertes.fr/hal-00397854
Contributor : Frédéric Darracq <>
Submitted on : Tuesday, June 23, 2009 - 2:30:29 PM
Last modification on : Thursday, October 4, 2018 - 11:14:07 AM

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  • HAL Id : hal-00397854, version 1

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A. Bocquillon, G. Foucard, F. Miller, Nadine Buard, R. Leveugle, et al.. Highlights of Laser Testing Capabilities Regarding the Understanding of SEE in SRAM-based FPGA. 9th European Conference on Radiation and its Effects on Components and Systems (RADECS), Sep 2007, Deauville, France. pp.36-42. ⟨hal-00397854⟩

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