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Study of Single Event Transients in High-Speed Operational Amplifiers

Abstract : This paper presents a simulation and experimental study of the analog single-event transient sensitivity of wide bandwidth operational amplifiers. Architecture effects are presented that could influence ASIC design and COTS selection.
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https://hal.archives-ouvertes.fr/hal-00397747
Contributor : Frédéric Darracq <>
Submitted on : Tuesday, June 23, 2009 - 10:42:23 AM
Last modification on : Thursday, October 4, 2018 - 11:14:07 AM

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  • HAL Id : hal-00397747, version 1

Citation

Patrice Jaulent, Vincent Pouget, Dean Lewis, Pascal Fouillat. Study of Single Event Transients in High-Speed Operational Amplifiers. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2008, 55 (4), pp.1974-1981. ⟨hal-00397747⟩

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