Study of Single Event Transients in High-Speed Operational Amplifiers

Abstract : This paper presents a simulation and experimental study of the analog single-event transient sensitivity of wide bandwidth operational amplifiers. Architecture effects are presented that could influence ASIC design and COTS selection.
Type de document :
Article dans une revue
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2008, 55 (4), pp.1974-1981
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https://hal.archives-ouvertes.fr/hal-00397747
Contributeur : Frédéric Darracq <>
Soumis le : mardi 23 juin 2009 - 10:42:23
Dernière modification le : jeudi 4 octobre 2018 - 11:14:07

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  • HAL Id : hal-00397747, version 1

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Patrice Jaulent, Vincent Pouget, Dean Lewis, Pascal Fouillat. Study of Single Event Transients in High-Speed Operational Amplifiers. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2008, 55 (4), pp.1974-1981. 〈hal-00397747〉

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