Electrical Modeling for Laser Testing with Different Pulse Durations

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Conference papers
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https://hal.archives-ouvertes.fr/hal-00397739
Contributor : Frédéric Darracq <>
Submitted on : Tuesday, June 23, 2009 - 10:31:24 AM
Last modification on : Thursday, October 4, 2018 - 11:14:07 AM

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  • HAL Id : hal-00397739, version 1

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Alexandre Douin, Vincent Pouget, Dean Lewis, Pascal Fouillat, Phillipe Perdu. Electrical Modeling for Laser Testing with Different Pulse Durations. 11th IEEE International On Line Testing Symposium, Jul 2005, Saint Raphael, France. pp.9-13. ⟨hal-00397739⟩

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