Complete Design and Measurement Methodology for a Tunable RF Impedance-Matching Network

C. Hoarau (1) , N. Corrao (1) , Jean-Daniel Arnould (1) , P. Ferrari (1) , P. Xavier (1)

1 IMEP-LAHC - Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation

This paper presents the design, fabrication, and characterization of a compact narrowband tunable impedance-matching network. A prototype was fabricated in hybrid technology using coplanar waveguide transmission lines and surface-mounted components. The network consists of a II-structure with tunable components made of varactors in series with inductors. Simulations and measurements are in good agreement. A new measurement methodology suitable for tunable impedance-matching networks is proposed. The results show that complex impedances with magnitudes varying from 6 Omega to 1 kOmega can be matched at 1 GHz and tuned in a 50% bandwidth. In addition, nonlinear measurements were done to fully characterize the network. The 1-dB compression point is reached at an input power of 20 dBm, while the input power for the third-order intermodulation intercept point is 21.3 dBm for a 1-kHz offset between the two input frequencies.

Mots clés: Fabrication; Transmission line measurements; Surface impedance; identification; impedance matching; UHF circuits; varactors; RF impedance-matching network; coplanar waveguide transmission lines; intermodulation intercept point; resistance 6 ohm to 1 kohm; bandwidth 1 GHz; Design methodology; Impedance measurement; Radio frequency; Narrowband; Prototypes; Surface-mount technology; Coplanar waveguides; Coplanar waveguide; impedance-matching network; reconfigurable; tuner

Domaines: Micro et nanotechnologies/Microélectronique; Electromagnétisme

C. Hoarau, N. Corrao, Jean-Daniel Arnould, P. Ferrari, P. Xavier. Complete Design and Measurement Methodology for a Tunable RF Impedance-Matching Network. IEEE Transactions on Microwave Theory and Techniques, 2008, 56 (11), pp.2620-2627. ⟨10.1109/TMTT.2008.2006105⟩. ⟨hal-02084223⟩