Ultracompact silicon-on-insulator ridge-waveguide mirrors with high reflectance

Philippe Velha (1) , Jean-Claude Rodier (2) , Philippe Lalanne (2) , Jean-Paul Hugonin (2) , David Peyrade (1) , Eric Picard (3) , Thomas Charvolin (3) , Emmanuel Hadji (3)

1 LTM - Laboratoire des technologies de la microélectronique
2 Laboratoire Charles Fabry de l'Institut d'Optique / Naphel
3 SiNaps - Silicon Nanoelectronics Photonics and Structures

Microcavities offering small modal volumes V_0.6 __/n_3 and consisting of two identical tapered Bragg mirrors etched into a monomode silicon-on-insulator ridge waveguide are studied for operation at telecommunications wavelengths. The authors have measured a Q factor of 8900, for a loaded cavity with a peak transmission at resonance in excess of 60%. The measured Q value quantitatively agrees with the calculation results and is 20 times larger than those previously reported for similar geometries without tapers.

Domaines: Optique [physics.optics]

Philippe Velha, Jean-Claude Rodier, Philippe Lalanne, Jean-Paul Hugonin, David Peyrade, et al.. Ultracompact silicon-on-insulator ridge-waveguide mirrors with high reflectance. Applied Physics Letters, 2006, 89 (17), pp.171121. ⟨10.1063/1.2372581⟩. ⟨hal-00394756⟩