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Ultracompact silicon-on-insulator ridge-waveguide mirrors with high reflectance

Abstract : Microcavities offering small modal volumes V_0.6 __/n_3 and consisting of two identical tapered Bragg mirrors etched into a monomode silicon-on-insulator ridge waveguide are studied for operation at telecommunications wavelengths. The authors have measured a Q factor of 8900, for a loaded cavity with a peak transmission at resonance in excess of 60%. The measured Q value quantitatively agrees with the calculation results and is 20 times larger than those previously reported for similar geometries without tapers.
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Submitted on : Monday, October 21, 2013 - 5:10:20 PM
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Philippe Velha, Jean-Claude Rodier, Philippe Lalanne, Jean-Paul Hugonin, David Peyrade, et al.. Ultracompact silicon-on-insulator ridge-waveguide mirrors with high reflectance. Applied Physics Letters, American Institute of Physics, 2006, 89 (17), pp.171121. ⟨10.1063/1.2372581⟩. ⟨hal-00394756⟩



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