Ultra-high-reflectivity photonic-bandgap mirrors in a ridge SOI waveguide - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue New Journal of Physics Année : 2006

Ultra-high-reflectivity photonic-bandgap mirrors in a ridge SOI waveguide

Résumé

Microcavities consisting of two identical tapered mirrors etched into silicon-on-insulator ridge waveguides are investigated for operation at telecommunication wavelengths. They offer very small modal volumes of approximately 0.6 (λ/n)3 and calculated intrinsic Q factors of 400 000. We have measured a Q factor of 8900 for a loaded cavity, in agreement with the theoretical value. In contrast to recent works performed on suspended membranes, the buried SiO2 layer is not removed. The cavities possess strong mechanical robustness, thus making them attractive from the viewpoint of integration in large systems. The cavity Q factor is much larger than those previously obtained for similar geometries on a substrate.
Fichier principal
Vignette du fichier
00394753.pdf (459.95 Ko) Télécharger le fichier
Origine : Fichiers éditeurs autorisés sur une archive ouverte
Loading...

Dates et versions

hal-00394753 , version 1 (11-04-2016)

Identifiants

Citer

Philippe Velha, Jean-Claude Rodier, Philippe Lalanne, Jean-Paul Hugonin, D. Peyrade, et al.. Ultra-high-reflectivity photonic-bandgap mirrors in a ridge SOI waveguide. New Journal of Physics, 2006, 8, pp.204. ⟨10.1088/1367-2630/8/9/204⟩. ⟨hal-00394753⟩
184 Consultations
159 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More