, Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications, Microelect. Reliab, pp.9-111781, 2004.
, Induced Charged-Device Model Test Method for ElectroStatic-Discharge-Withstand Thresholds of Microelectronic Components, JESD22- C101C (Revision of JESD22-C101B.01), JEDEC Solid State Technology Association, 2004.
, Transimpedance amplifier-based full low-frequency noise characterization setup for Si/SiGe HBTs, IEEE Transactions on Electron Devices, vol.48, issue.4, pp.767-73, 2001.
DOI : 10.1109/16.915724
, Noise as a diagnostic tool for quality and reliability of electronic devices, IEEE Transactions on Electron Devices, vol.41, issue.11, pp.2176-87, 1994.
DOI : 10.1109/16.333839
, Device electronics for integrated circuits, 1986.
, Trapped charges detection after CDM stress using a sensitive failure analysis Low Frequency Noise measurement technique, Lake Tahoe (USA), 2007.
, Test circuits for fast and reliable assessment of CDM robustness of I/O stages, Proceedings of EOS/ESD Symposium, pp.319-327, 2003.
DOI : 10.1016/j.microrel.2004.05.014
, Kamins: Device electronics for integrated circuits, 1986.
, Caractérisation de défauts latents dans les circuits intégrés soumis à des décharges électrostatiques, 2006.
, Correlation of the generation-recombination noise with reliability issues of polycrystalline silicon thin-film transistors, Applied Physics Letters, vol.85, issue.2, p.311, 2004.
DOI : 10.1063/1.1769073
, Effect of mesa overgrowth on low-frequency noise in planar separate absorption, grading, charge, and multiplication avalanche photodiodes, IEEE Journal of Quantum Electronics, vol.35, issue.8, pp.1196-1202, 1999.
DOI : 10.1109/3.777220
, Theory and experiments of low-frequency generation-recombination noise in MOS transistors, IEEE Transactions on Electron Devices, vol.16, issue.2, pp.170-177, 1969.
DOI : 10.1109/T-ED.1969.16586