Characterization of a 3D defect using the Expected Improvement algorithm

Abstract : Purpose -- The purpose of this paper is to provide a new methodology for the characterization of a defect by eddy-current testing ({ECT}). The defect is embedded in a conductive non-magnetic plate and the measured data are the impedance variation of an air-cored probe coil scanning above the top of the plate. Design/methodology/approach -- The inverse problem of defect characterization is solved by an iterative global optimization process. The strategy of the iterations is the kriging-based expected improvement ({EI}) global optimization algorithm. The forward problem is solved numerically, using a volume integral approach. Findings -- The proposed method seems to be efficient in the light of the presented numerical results. Further investigation and comparison to other methods are still needed. Originality/value -- This is believed to be the first time when the EI algorithm has been used to solve an inverse problem related to the {ECT}.
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Contributor : Marc Lambert <>
Submitted on : Tuesday, May 5, 2009 - 4:02:57 PM
Last modification on : Thursday, April 5, 2018 - 12:30:05 PM

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Sandor Bilicz, Emmanuel Vazquez, Marc Lambert, Szabolcs Gyimothy, Jozsef Pavo. Characterization of a 3D defect using the Expected Improvement algorithm. COMPEL: The International Journal for Computation and Mathematics in Electrical and Electronic Engineering, Emerald, 2009, 28 (4), pp.851--864. ⟨10.1108/03321640910958964⟩. ⟨hal-00381468⟩



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