Electrochemical impedance spectroscopy and surface plasmon resonance studies of DNA hybridization on gold/SiO<sub><i>x</i></sub> interfaces - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Analyst Année : 2008

Electrochemical impedance spectroscopy and surface plasmon resonance studies of DNA hybridization on gold/SiOx interfaces

Résumé

The use of Au/SiOx interfaces for the investigation of DNA hybridization using electrochemical impedance spectroscopy (EIS) and surface plasmon resonance (SPR) simultaneously is demonstrated. Standard glass chemistry was used to link single-stranded DNA (ss-DNA) on aldehyde-terminated Au/SiOx interfaces. The layer thickness and amount of grafted oligonucleotides (ODNs) were calculated from SPR on the basis of a multilayer system of glass/Ti/Au/SiOx/grafted molecule. Capacitance and resistance values of the modified interface before and after hybridization were calculated from EIS data using an equivalent circuit and allowed the affinity rate constant, KA = 4.07 × 105 M-1, to be determined. The EIS results were comparable to those obtained by SPR hybridization kinetics recorded in parallel.

Domaines

Matériaux

Dates et versions

hal-00365585 , version 1 (03-03-2009)

Identifiants

Citer

Maël Manesse, Valérie Stambouli, Rabah Boukherroub, Sabine Szunerits. Electrochemical impedance spectroscopy and surface plasmon resonance studies of DNA hybridization on gold/SiOx interfaces. Analyst, 2008, 133 (8), pp. 1097-1103. ⟨10.1039/b804825h⟩. ⟨hal-00365585⟩
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