Investigation of behavior and potentialities in high frequency range of metallic source/drain architecture for advanced MOSFET transistors - Archive ouverte HAL Accéder directement au contenu
Autre Publication Scientifique Année : 2008

Investigation of behavior and potentialities in high frequency range of metallic source/drain architecture for advanced MOSFET transistors

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hal-00362090 , version 1 (17-02-2009)

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  • HAL Id : hal-00362090 , version 1

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R. Valentin. Investigation of behavior and potentialities in high frequency range of metallic source/drain architecture for advanced MOSFET transistors. 2008. ⟨hal-00362090⟩
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