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Evaluation of SRAMs reliability for space electronics using ultrashort laser pulses

Abstract : This paper proposes a complete method dedicated to the evaluation of SRAMs sensitivity to single event upsets using ultrashort laser pulses.
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https://hal.archives-ouvertes.fr/hal-00359396
Contributor : Frédéric Darracq <>
Submitted on : Friday, February 6, 2009 - 5:18:33 PM
Last modification on : Thursday, October 4, 2018 - 11:14:07 AM

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  • HAL Id : hal-00359396, version 1

Citation

Frédéric Darracq, Herve Lapuyade, Pascal Fouillat, Vincent Pouget, Dean Lewis, et al.. Evaluation of SRAMs reliability for space electronics using ultrashort laser pulses. Journal of Integrated Circuits and Systems, Brazilian Microelectronics Society, 2006, 1 (3), pp.11 -16. ⟨hal-00359396⟩

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