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Gate pulse electrical method to characterize hysteresis phenomena in organic field effect transistor

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https://hal.archives-ouvertes.fr/hal-00357293
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Submitted on : Friday, January 30, 2009 - 8:43:34 AM
Last modification on : Wednesday, March 23, 2022 - 3:50:21 PM

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C. Petit, D. Zander, K. Lmimouni, M. Ternisien, D. Tondelier, et al.. Gate pulse electrical method to characterize hysteresis phenomena in organic field effect transistor. Organic Electronics, Elsevier, 2008, 9, pp.979-984. ⟨10.1016/j.orgel.2008.07.013⟩. ⟨hal-00357293⟩

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