HAL will be down for maintenance from Friday, June 10 at 4pm through Monday, June 13 at 9am. More information
Skip to Main content Skip to Navigation
Journal articles

Gate pulse electrical method to characterize hysteresis phenomena in organic field effect transistor

C. Petit D. Zander K. Lmimouni M. Ternisien D. Tondelier S. Lenfant D. Vuillaume 1
1 IEMN - Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520
Document type :
Journal articles
Complete list of metadata
https://hal.archives-ouvertes.fr/hal-00357293
Contributor : Collection Iemn Connect in order to contact the contributor
Submitted on : Friday, January 30, 2009 - 8:43:34 AM
Last modification on : Wednesday, March 23, 2022 - 3:50:21 PM

Links full text

istex

Identifiers

Collections

IEMN | CNRS | UNIV-LILLE | UNIV-VALENCIENNES

Citation

C. Petit, D. Zander, K. Lmimouni, M. Ternisien, D. Tondelier, et al.. Gate pulse electrical method to characterize hysteresis phenomena in organic field effect transistor. Organic Electronics, Elsevier, 2008, 9, pp.979-984. ⟨10.1016/j.orgel.2008.07.013⟩. ⟨hal-00357293⟩

Export

BibTeX TEI DC DCterms EndNote Datacite

Share

Metrics

Record views

34