Reliability investigations of 850 nm silicon photodiodes under proton irradiation for space applications

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https://hal.archives-ouvertes.fr/hal-00334728
Contributor : Isabelle Bord <>
Submitted on : Monday, October 27, 2008 - 4:26:09 PM
Last modification on : Thursday, January 11, 2018 - 6:21:06 AM

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  • HAL Id : hal-00334728, version 1

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M.L. Bourqui, L. Bechou, O. Gilard, Y. Deshayes, P. del Vecchio, et al.. Reliability investigations of 850 nm silicon photodiodes under proton irradiation for space applications. Microelectronics Reliability, Elsevier, 2008, pp.1202-1207. ⟨hal-00334728⟩

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