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OBIC technique for ESD defect localization : Influence of the experimental procedure

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https://hal.archives-ouvertes.fr/hal-00327412
Contributor : Frédéric Darracq Connect in order to contact the contributor
Submitted on : Wednesday, October 8, 2008 - 2:22:14 PM
Last modification on : Tuesday, October 19, 2021 - 11:16:21 PM

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  • HAL Id : hal-00327412, version 1

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F. Essely, Nicolas Guitard, F. Darracq, V. Pouget, Marise Bafleur, et al.. OBIC technique for ESD defect localization : Influence of the experimental procedure. 3th Workshop EOS/ESD/EMI, May 2006, Toulouse, France. pp.79-81. ⟨hal-00327412⟩

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