High resolution X-ray diffraction microstructural analysis of oxide epitaxial thin films

R. Bachelet (1) , Florine Conchon (1) , Alexandre Boulle (2) , René Guinebretière (2)

1 SPCTS - Science des Procédés Céramiques et de Traitements de Surface
2 Axe 3 : organisation structurale multiéchelle des matériaux

R. Bachelet, Florine Conchon, Alexandre Boulle, René Guinebretière. High resolution X-ray diffraction microstructural analysis of oxide epitaxial thin films. 5th Size Strain Conference, Oct 2007, Garmisch, Germany. ⟨hal-00290688⟩