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Conference papers

Coupling on-wafer measurement errors and their impact on calibration and de-embedding up to 110 GHz for CMOS millimeter wave characterizations

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https://hal.archives-ouvertes.fr/hal-00284025
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Submitted on : Monday, June 2, 2008 - 10:08:44 AM
Last modification on : Wednesday, March 23, 2022 - 3:50:21 PM

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C. Andrei, D. Gloria, Francois Danneville, P. Scheer, Gilles Dambrine. Coupling on-wafer measurement errors and their impact on calibration and de-embedding up to 110 GHz for CMOS millimeter wave characterizations. IEEE International Conference on Microelectronic Test Structures, ICMTS'07, 2007, Japan. pp.253-256, ⟨10.1109/ICMTS.2007.374494⟩. ⟨hal-00284025⟩

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