Spatially resolved Raman spectroscopy of single- and few-layer graphene

D. Graf , F. Molitor , K. Ensslin , C. Stampfer , A. Jungen , C. Hierold , L. Wirtz (1)

1 IEMN - Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520

We present Raman spectroscopy measurements on single- and few-layer graphene flakes. Using a scanning confocal approach we collect spectral data with spatial resolution, which allows us to directly compare Raman images with scanning force micrographs. Single-layer graphene can be distinguished from double- and few-layer by the width of the D’ line: the single peak for single-layer graphene splits into different peaks for the double-layer. These findings are explained using the double-resonant Raman model based on ab-initio calculations of the electronic structure and of the phonon dispersion. We investigate the D line intensity and find no defects within the flake. A finite D line response originating from the edges can be attributed either to defects or to the breakdown of translational symmetry

Domaines: Sciences de l'ingénieur [physics]

D. Graf, F. Molitor, K. Ensslin, C. Stampfer, A. Jungen, et al.. Spatially resolved Raman spectroscopy of single- and few-layer graphene. Nano Letters, 2007, 7 (2), pp.238-242. ⟨10.1021/nl061702a⟩. ⟨hal-00283156⟩