A Temperature and Power Supply Independent CMOS Voltage Reference for Built-In Self-Test

Abstract : In this paper, the design of a temperature independent voltage reference for built-in self-test applications is presented; starting from BIST results on a 2.4 GHz LNA carried out monitoring a voltage node of the circuit, the need for a rapidly exportable temperature independent voltage reference is shown. The voltage reference – designed in STM 65 nm CMOS technology – works with a 0.9 V supply voltage and the low power consumption at room temperature of 27 μW. Its area is as low as 0.0064 mm2 and post-layout simulations show good performances of 12.8 ppm output voltage variations over 250°C and an output voltage variation of 1.4 mV for a supply voltage sweep between 1.0 V and 1.25 V.
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Conference papers
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https://hal.archives-ouvertes.fr/hal-00269293
Contributor : Equipe Conception de Circuits <>
Submitted on : Wednesday, April 2, 2008 - 4:05:07 PM
Last modification on : Wednesday, October 9, 2019 - 9:30:27 PM

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  • HAL Id : hal-00269293, version 1

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Luca Testa, Mikael Cimino, Herve Lapuyade, Yann Deval, Jean-Louis Carbonero, et al.. A Temperature and Power Supply Independent CMOS Voltage Reference for Built-In Self-Test. 13th IEEE European Test Symposium, May 2008, Verbania, Italy. pp.69-72. ⟨hal-00269293⟩

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