Preparation and characterization of germanium oxysulfide glassy films for optics

Clément Maurel (1) , Thierry Cardinal (1) , Philippe Vinatier (1) , Laëtitia Petit (2) , Kathleen Richardson (2) , N. Carlie (2) , François Guillen (1) , Michel Lahaye (1) , Michel Couzi (3) , Frédéric Adamietz (3) , Vincent Rodriguez (3) , François Lagugne-Labarthet (3) , Virginie Nazabal (4) , Arnaud Royon (5) , Lionel Canioni (5)

1 ICMCB - Institut de Chimie de la Matière Condensée de Bordeaux
2 School of Materials Science and Engineering
3 ISM - Institut des Sciences Moléculaires
4 ISCR - Institut des Sciences Chimiques de Rennes
5 CPMOH - Centre de physique moléculaire optique et hertzienne

Homogeneous amorphous films in the GeS2-GeO2 system have been deposited by a rf sputtering technique. Optical characterizations have shown that the cut-off wavelength and the linear indices increase with an increase in the S/O ratio. Raman spectroscopy indicates the presence of new modes that can be assigned to intermediate germanium oxysulfide structural units. Photo-sensitivity of the oxysulfide films has been demonstrated for irradiation near the band-gap. Diffraction gratings inscribed using 488 nm exposure displayed a limited diffraction efficiency (≤3%) that weakens with a corresponding decrease in the glass S/O ratio.

Mots clés: Glasses; Thin films; Raman spectroscopy; Optical properties

Domaines: Matériaux

Clément Maurel, Thierry Cardinal, Philippe Vinatier, Laëtitia Petit, Kathleen Richardson, et al.. Preparation and characterization of germanium oxysulfide glassy films for optics. Materials Research Bulletin, 2008, 43 (5), pp.1179-1187. ⟨10.1016/j.materresbull.2007.05.032⟩. ⟨hal-00267763⟩