Real time in situ hard X-ray texture evolution during the annealing of rolled CuNi tapes
Résumé
A new real time in-situ scattering method to study texture evolution kinetics is detailed. The technique is adapted from an existing set up used at the Institut Laue-Langevin neutron facility to check monochromators. It uses a white hard X-ray beam and works in transmission geometry. A 2D detector allows following of the recrystallization phenomena. A study of the annealing behavior of copper-nickel alloy rolled tapes, used as a substrate for high temperature superconductors, is presented.
Domaines
Matériaux
Origine : Fichiers produits par l'(les) auteur(s)
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