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Article Dans Une Revue Applied physics. A, Materials science & processing Année : 2007

Real time in situ hard X-ray texture evolution during the annealing of rolled CuNi tapes

Résumé

A new real time in-situ scattering method to study texture evolution kinetics is detailed. The technique is adapted from an existing set up used at the Institut Laue-Langevin neutron facility to check monochromators. It uses a white hard X-ray beam and works in transmission geometry. A 2D detector allows following of the recrystallization phenomena. A study of the annealing behavior of copper-nickel alloy rolled tapes, used as a substrate for high temperature superconductors, is presented.

Domaines

Matériaux
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Dates et versions

hal-00264753 , version 1 (18-03-2008)

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Antoine Girard, Pierre Bastie, Jean-Louis Soubeyroux. Real time in situ hard X-ray texture evolution during the annealing of rolled CuNi tapes. Applied physics. A, Materials science & processing, 2007, 90 (1), pp.179-184. ⟨10.1007/s00339-007-4254-8⟩. ⟨hal-00264753⟩
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