External Optical Probe for Novel on-line Testing Method of Digital Circuits

Benoit Pannetier (1) , Pierre Lemaitre-Auger (1) , Smail Tedjini (1) , El Hadj Dogheche (2)

1 LCIS - Laboratoire de Conception et d'Intégration des Systèmes
2 IEMN - Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520

An electro-optical (EO) probe dedicated to the on-line testing of electronic systems is presented here. The probe is design to be implanted permanently on an electronic circuit. It is made of PZT material comprises between two electrodes that also act as optical mirrors. The upper mirror is a multi-layer stack of Si/SiO2 while the second is made of Pt. Reflectivity changes of 7.2 % for a signal variation comprise between 0 and 5 volts were obtained.

Domaines: Electronique; Optique / photonique

Benoit Pannetier, Pierre Lemaitre-Auger, Smail Tedjini, El Hadj Dogheche. External Optical Probe for Novel on-line Testing Method of Digital Circuits. 27th General Assembly of the International Union of Radio Science, Aug 2003, Maastricht, Netherlands. paper #847, 1-4. ⟨hal-00261725⟩