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Communication Dans Un Congrès Année : 2008

Unusual noise behavior versus temperature in nFinFETs on silicon on insulator (SOI) substrates processed with different strain techniques

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Electronique
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Dates et versions

hal-00259455 , version 1 (28-02-2008)

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  • HAL Id : hal-00259455 , version 1

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Wei Guo, Jean-Marc Routoure, Bogdan Cretu, Régis Carin. Unusual noise behavior versus temperature in nFinFETs on silicon on insulator (SOI) substrates processed with different strain techniques. EUROSOI 2008 CONFERENCE PROCEEDINGS FOURTH WORKSHOP OF THE THEMATIC NETWORK ON SILICON-ON-INSULATOR TECHNOLOGY, 2008, dublin, Ireland. ⟨hal-00259455⟩
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