Backside SEU laser testing for commercial off-the-shelf SRAMs

Abstract : This paper presents a new methodology for single-event upset laser testing of commercial off-the-shelf SRAMs. This methodology is based on backside laser test and is illustrated with some experimental results obtained with a new dedicated laser test bench.
Type de document :
Article dans une revue
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2002, 49 (6), pp.2977-2983, 10.1109/TNS.2002.805393. 〈10.1109/TNS.2002.805393〉
Liste complète des métadonnées

https://hal.archives-ouvertes.fr/hal-00204728
Contributeur : Frédéric Darracq <>
Soumis le : mardi 15 janvier 2008 - 14:28:54
Dernière modification le : jeudi 11 janvier 2018 - 06:21:06

Identifiants

Citation

Frédéric Darracq, Herve Lapuyade, Nadine Buard, Faresse Mounsi, Bruno Foucher, et al.. Backside SEU laser testing for commercial off-the-shelf SRAMs. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2002, 49 (6), pp.2977-2983, 10.1109/TNS.2002.805393. 〈10.1109/TNS.2002.805393〉. 〈hal-00204728〉

Partager

Métriques

Consultations de la notice

130