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Backside SEU laser testing for commercial off-the-shelf SRAMs

Abstract : This paper presents a new methodology for single-event upset laser testing of commercial off-the-shelf SRAMs. This methodology is based on backside laser test and is illustrated with some experimental results obtained with a new dedicated laser test bench.
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https://hal.archives-ouvertes.fr/hal-00204728
Contributor : Frédéric Darracq Connect in order to contact the contributor
Submitted on : Tuesday, January 15, 2008 - 2:28:54 PM
Last modification on : Tuesday, February 2, 2021 - 4:30:04 PM

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Frédéric Darracq, Herve Lapuyade, Nadine Buard, Faresse Mounsi, Bruno Foucher, et al.. Backside SEU laser testing for commercial off-the-shelf SRAMs. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2002, 49 (6), pp.2977-2983, 10.1109/TNS.2002.805393. ⟨10.1109/TNS.2002.805393⟩. ⟨hal-00204728⟩

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