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Picosecond Timing Analysis in Integrated Circuits with Pulsed Laser Stimulation

Abstract : This paper presents new approaches for timing analysis in fast integrated circuits using picosecond pulsed laser stimulation. The proposed techniques provide very good temporal resolution as illustrated by several case studies on digital test structures. They can be used for localizing defects inducing timing faults.
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Conference papers
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https://hal.archives-ouvertes.fr/hal-00204584
Contributor : Frédéric Darracq <>
Submitted on : Tuesday, January 15, 2008 - 9:57:21 AM
Last modification on : Thursday, July 25, 2019 - 4:34:15 PM

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Alexandre Douin, Vincent Pouget, Dean Lewis, Pascal Fouillat, Philippe Perdu. Picosecond Timing Analysis in Integrated Circuits with Pulsed Laser Stimulation. 45th annual ieee International Reliability Physics Symposium (IRPS), Apr 2007, Phoenix, United States. pp.520-525, 10.1109/RELPHY.2007.369945, ⟨10.1109/RELPHY.2007.369945⟩. ⟨hal-00204584⟩

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