Picosecond Timing Analysis in Integrated Circuits with Pulsed Laser Stimulation

Abstract : This paper presents new approaches for timing analysis in fast integrated circuits using picosecond pulsed laser stimulation. The proposed techniques provide very good temporal resolution as illustrated by several case studies on digital test structures. They can be used for localizing defects inducing timing faults.
Type de document :
Communication dans un congrès
45th annual ieee International Reliability Physics Symposium (IRPS), Apr 2007, Phoenix, United States. pp.520-525, 10.1109/RELPHY.2007.369945, 2007, 〈10.1109/RELPHY.2007.369945〉
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https://hal.archives-ouvertes.fr/hal-00204584
Contributeur : Frédéric Darracq <>
Soumis le : mardi 15 janvier 2008 - 09:57:21
Dernière modification le : jeudi 4 octobre 2018 - 11:14:07

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Alexandre Douin, Vincent Pouget, Dean Lewis, Pascal Fouillat, Philippe Perdu. Picosecond Timing Analysis in Integrated Circuits with Pulsed Laser Stimulation. 45th annual ieee International Reliability Physics Symposium (IRPS), Apr 2007, Phoenix, United States. pp.520-525, 10.1109/RELPHY.2007.369945, 2007, 〈10.1109/RELPHY.2007.369945〉. 〈hal-00204584〉

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