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Polarized micro-Raman spectroscopy for studying stresses in as-grown and tensile-tested diamond films

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https://hal.archives-ouvertes.fr/hal-00194734
Contributor : Patrick Simon <>
Submitted on : Friday, December 7, 2007 - 12:52:01 PM
Last modification on : Wednesday, December 23, 2020 - 7:10:02 PM

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T. Gries, L. Vandenbulcke, Patrick Simon, A. Canizares. Polarized micro-Raman spectroscopy for studying stresses in as-grown and tensile-tested diamond films. Surface and Coatings Technology, Elsevier, 2008, 202, pp.2263-2267. ⟨10.1016/j.surfcoat.2007.08.050⟩. ⟨hal-00194734⟩

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