On-Chip pseudorandom testing for linear and non-linear MEMS

A. Dhayni (1) , Salvador Mir (1) , Libor Rufer (1)

1 TIMA - Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés

In this paper we study the use of pseudorandom test techniques for linear and nonlinear devices, in particular Micro Electro Mechanical Systems (MEMS). These test techniques lead to practical Built- In-Self-Test techniques (BIST). We will first present the pseudorandom test technique for Linear Time Invariant (LTI) systems. Next, we will illustrate and evaluate the application of these techniques for weakly nonlinear, purely nonlinear and strongly nonlinear devices.

Mots clés: on-chip-pseudorandom-MEMS-testing

Domaines: Micro et nanotechnologies/Microélectronique

A. Dhayni, Salvador Mir, Libor Rufer. On-Chip pseudorandom testing for linear and non-linear MEMS. Reis, Ricardo; Osseiran, Adam; Pfleiderer, Hans-Joerg. VLSI-SOC: From Systems to Silicon, Springer, pp.245-266, Vol. 240, 2007, Collection :: IFIP International Federation for Information Processing, ⟨10.1007/978-0-387-73661-7⟩. ⟨hal-00185934⟩