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Analysis of Latchup susceptibility to internal logical states by using a Laser beam

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https://hal.archives-ouvertes.fr/hal-00185418
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Submitted on : Tuesday, November 6, 2007 - 9:05:31 AM
Last modification on : Thursday, January 11, 2018 - 6:21:08 AM

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  • HAL Id : hal-00185418, version 1

Citation

Pascal Fouillat, Hervé Lapuyade, Yvan Maidon, Jean-Paul Dom. Analysis of Latchup susceptibility to internal logical states by using a Laser beam. Proc. of the 5th European Conference on Electron and Optical Beam Testing of Electronic Devices, 1996, Germany. pp.1. ⟨hal-00185418⟩

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