Analysis of Latchup susceptibility to internal logical states by using a Laser beam

Type de document :
Communication dans un congrès
Proc. of the 5th European Conference on Electron and Optical Beam Testing of Electronic Devices, 1996, Germany. NC, pp.1, 1996
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https://hal.archives-ouvertes.fr/hal-00185418
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Soumis le : mardi 6 novembre 2007 - 09:05:31
Dernière modification le : jeudi 11 janvier 2018 - 06:21:08

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  • HAL Id : hal-00185418, version 1

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Pascal Fouillat, Hervé Lapuyade, Yvan Maidon, Jean-Paul Dom. Analysis of Latchup susceptibility to internal logical states by using a Laser beam. Proc. of the 5th European Conference on Electron and Optical Beam Testing of Electronic Devices, 1996, Germany. NC, pp.1, 1996. 〈hal-00185418〉

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