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Communication Dans Un Congrès Année : 1996

Analysis of Latchup susceptibility to internal logical states by using a Laser beam

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hal-00185418 , version 1 (06-11-2007)

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  • HAL Id : hal-00185418 , version 1

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Pascal Fouillat, Hervé Lapuyade, Yvan Maidon, Jean-Paul Dom. Analysis of Latchup susceptibility to internal logical states by using a Laser beam. Proc. of the 5th European Conference on Electron and Optical Beam Testing of Electronic Devices, 1996, Germany. pp.1. ⟨hal-00185418⟩
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