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Implementation of Laser Beam Sensitive Cells : a new approach for integrated circuits testing

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https://hal.archives-ouvertes.fr/hal-00185408
Contributor : Ims Import <>
Submitted on : Tuesday, November 6, 2007 - 9:05:26 AM
Last modification on : Tuesday, February 2, 2021 - 4:30:02 PM

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  • HAL Id : hal-00185408, version 1

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Pascal Fouillat, Stéphane Gervais-Ducouret, Hervé Lapuyade, Jean-Paul Dom. Implementation of Laser Beam Sensitive Cells : a new approach for integrated circuits testing. Quality and Reliability Engineering International, Wiley, 1994, 10, pp.1. ⟨hal-00185408⟩

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