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Laser Cross Section Measurement for the Evaluation of Single-Event Effects in Integrated Circuits

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https://hal.archives-ouvertes.fr/hal-00185403
Contributor : Ims Import <>
Submitted on : Tuesday, November 6, 2007 - 9:05:25 AM
Last modification on : Tuesday, February 2, 2021 - 4:30:02 PM

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  • HAL Id : hal-00185403, version 1

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Vincent Pouget, Pascal Fouillat, Dean Lewis, Hervé Lapuyade, Frédéric Darracq, et al.. Laser Cross Section Measurement for the Evaluation of Single-Event Effects in Integrated Circuits. Microelectronics Reliability, Elsevier, 2000, 40, pp.1. ⟨hal-00185403⟩

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