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Front side and Backside OBIT Mappings applied to Single Event Transient Testing

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https://hal.archives-ouvertes.fr/hal-00185401
Contributor : Ims Import <>
Submitted on : Tuesday, November 6, 2007 - 9:05:24 AM
Last modification on : Thursday, October 4, 2018 - 11:14:07 AM

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  • HAL Id : hal-00185401, version 1

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Dean Lewis, Vincent Pouget, Thomas Beauchene, Hervé Lapuyade, Pascal Fouillat, et al.. Front side and Backside OBIT Mappings applied to Single Event Transient Testing. Microelectronics Reliability, Elsevier, 2001, 41, pp.1. ⟨hal-00185401⟩

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