Skip to Main content Skip to Navigation
Journal articles

Backside Laser Testing of ICs for SET Sensitivity Evaluation

Complete list of metadatas

https://hal.archives-ouvertes.fr/hal-00185400
Contributor : Ims Import <>
Submitted on : Tuesday, November 6, 2007 - 9:05:23 AM
Last modification on : Thursday, October 4, 2018 - 11:14:07 AM

Identifiers

  • HAL Id : hal-00185400, version 1

Citation

Dean Lewis, Vincent Pouget, Félix Beaudoin, Philippe Perdu, Hervé Lapuyade, et al.. Backside Laser Testing of ICs for SET Sensitivity Evaluation. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2001, 48, pp.1. ⟨hal-00185400⟩

Share

Metrics

Record views

122