Backside SEU laser testing for commercial off-the-shelf SRAMs

Frédéric Darracq (1) , Herve Lapuyade (1) , Nadine Buard (2) , Faresse Mounsi (2) , Bruno Foucher (3) , Pascal Fouillat (1) , M. C. Calvet (4) , R. Dufayel (4)

1 IMS - Laboratoire de l'intégration, du matériau au système
2 EADS, Corporate Research Center
3 EADS, Corporate Research Center
4 EADS, Launch Vehicles

This paper presents a new methodology for single-event upset laser testing of commercial off-the-shelf SRAMs. This methodology is based on backside laser test and is illustrated with some experimental results obtained with a new dedicated laser test bench.

Domaines: Electronique; Micro et nanotechnologies/Microélectronique

Frédéric Darracq, Herve Lapuyade, Nadine Buard, Faresse Mounsi, Bruno Foucher, et al.. Backside SEU laser testing for commercial off-the-shelf SRAMs. IEEE Transactions on Nuclear Science, 2002, 49 (6), pp.2977-2983, 10.1109/TNS.2002.805393. ⟨10.1109/TNS.2002.805393⟩. ⟨hal-00204728⟩