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Backside SEU Laser Testing for Commercial-Off-The-Shelf SRAM

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https://hal.archives-ouvertes.fr/hal-00185397
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Submitted on : Tuesday, November 6, 2007 - 9:05:20 AM
Last modification on : Thursday, January 11, 2018 - 6:21:08 AM

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  • HAL Id : hal-00185397, version 1

Citation

Frédéric Darracq, Hervé Lapuyade, N. Buard, F. Mounsi, Bruno Foucher, et al.. Backside SEU Laser Testing for Commercial-Off-The-Shelf SRAM. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2002, 49, pp.1. ⟨hal-00185397⟩

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