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Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations

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https://hal.archives-ouvertes.fr/hal-00183949
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Submitted on : Tuesday, October 30, 2007 - 12:39:06 PM
Last modification on : Thursday, January 11, 2018 - 6:21:08 AM

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  • HAL Id : hal-00183949, version 1

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Jean-Yves Deletage, Frédéric Verdier, Bernard Plano, Yannick Deshayes, Laurent Bechou, et al.. Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations. Microelectronics Reliability, Elsevier, 2003, 43, pp.1137-1144. ⟨hal-00183949⟩

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