Study of bit error by thermal characterization of a successive approximation ADC

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https://hal.archives-ouvertes.fr/hal-00183677
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Submitted on : Tuesday, October 30, 2007 - 11:05:27 AM
Last modification on : Thursday, January 11, 2018 - 6:21:08 AM

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  • HAL Id : hal-00183677, version 1

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Giovanni Franco, Dominique Dallet, Giovanni Chiorboli, Philippe Marchegay. Study of bit error by thermal characterization of a successive approximation ADC. IEEE Instrumentation and Measurement Technology Conference, 1995, United States. pp.1. ⟨hal-00183677⟩

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