Reliability analysis of ceramic capacitors under 200C

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https://hal.archives-ouvertes.fr/hal-00182907
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Submitted on : Monday, October 29, 2007 - 1:11:04 PM
Last modification on : Thursday, January 11, 2018 - 6:21:07 AM

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  • HAL Id : hal-00182907, version 1

Citation

Yves Ousten, Bruno Levrier, Frédéric Verdier. Reliability analysis of ceramic capacitors under 200C. CARTS Europe 2004: 18th Annual Passive Components Conference, 2004, France. pp.40-44. ⟨hal-00182907⟩

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