NON-DESTRUCTIVE DETECTION AND LOCALIZATION OF DEFECTS IN MULTILAYER CERAMIC CHIP CAPACITORS USING ELECTROMECHANICAL RESONANCES

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https://hal.archives-ouvertes.fr/hal-00181938
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Submitted on : Wednesday, October 24, 2007 - 4:46:45 PM
Last modification on : Thursday, January 11, 2018 - 6:21:07 AM

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  • HAL Id : hal-00181938, version 1

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Laurent Bechou, Said Mejdi, Yves Ousten, Yves Danto. NON-DESTRUCTIVE DETECTION AND LOCALIZATION OF DEFECTS IN MULTILAYER CERAMIC CHIP CAPACITORS USING ELECTROMECHANICAL RESONANCES. Quality and Reliability Engineering International, Wiley, 1996, 1, pp.1. ⟨hal-00181938⟩

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