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Application of Picosecond Ultrasonics to Non-Destructive Defect Analysis in VLSI Circuits

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https://hal.archives-ouvertes.fr/hal-00181929
Contributor : Ims Import <>
Submitted on : Wednesday, October 24, 2007 - 4:46:43 PM
Last modification on : Thursday, February 18, 2021 - 9:08:04 AM

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  • HAL Id : hal-00181929, version 1

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Grégory Andriamonje, Vincent Pouget, Yves Ousten, Dean Lewis, Yves Danto, et al.. Application of Picosecond Ultrasonics to Non-Destructive Defect Analysis in VLSI Circuits. Microelectronics Reliability, Elsevier, 2003, 1, pp.1. ⟨hal-00181929⟩

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