LFT Generation by Flatness Approach, for Mu-Analysis of HIRMplus Fighter Aircraft

Franck Cazaurang 1, 2 Loïc Lavigne 1, 2 Benoit Bergeon
1 LAP - Laboratoire d'Automatique et de Productique
2 IMS - Laboratoire de l'intégration, du matériau au système
Abstract : an LFT model representing the longitudinal dynamic of the gap between the open loop nominal HIRM+ model and the perturbed model on a trajectory is given. Five of the most relevant uncertainties on the pitch axis are considered. This model describes the gap along a trajectory passing through flight condition FC1, with an angle of attack equal to 6°. The proposed approach is based on a simplified longitudinal model used to determine a nominal trajectory and corresponding input. The specific outputs are angle of attack and pitch angle. These outputs allow a parametrisation of state-space trajectory. First the LFT generation by flatness approach is described. Then an LFT model of the open loop HIRM+ model for the above flight condition is given. Thereafter an LFT model of the closed loop HIRM+RIDE is proposed to allow the identification of worst case stability margin.
Type de document :
Chapitre d'ouvrage
Christopher Fielding, Andras Varga, Samir Bennani, and Michiel Selier. Advanced Techniques for Clearance of Flight Control Laws, Springer Berlin, pp.221-243, 2002, Lecture Notes in Control and Information Sciences, 〈10.1007/3-540-45864-6_14〉
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https://hal.archives-ouvertes.fr/hal-00180795
Contributeur : Franck Cazaurang <>
Soumis le : dimanche 21 octobre 2007 - 15:44:50
Dernière modification le : mercredi 28 février 2018 - 08:56:02

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IMS-BORDEAUX | UNIV-BORDEAUX | TDS-MACS | IMS-BORDEAUX-FUSION

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Franck Cazaurang, Loïc Lavigne, Benoit Bergeon. LFT Generation by Flatness Approach, for Mu-Analysis of HIRMplus Fighter Aircraft. Christopher Fielding, Andras Varga, Samir Bennani, and Michiel Selier. Advanced Techniques for Clearance of Flight Control Laws, Springer Berlin, pp.221-243, 2002, Lecture Notes in Control and Information Sciences, 〈10.1007/3-540-45864-6_14〉. 〈hal-00180795〉

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