Dynamic testing of A/D converters by means of the three-parameter sine-fit algorithm

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https://hal.archives-ouvertes.fr/hal-00180585
Contributor : Dominique Dallet <>
Submitted on : Friday, October 19, 2007 - 3:12:16 PM
Last modification on : Thursday, January 11, 2018 - 6:21:06 AM

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  • HAL Id : hal-00180585, version 1

Citation

Daniel Belega, Dominique Dallet. Dynamic testing of A/D converters by means of the three-parameter sine-fit algorithm. Measurement, Elsevier, 2007, 40 (1), pp.1-7. ⟨hal-00180585⟩

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