An improved method for automatic detection and location of defects in electronics components using scanning ultrasonic microscopy

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https://hal.archives-ouvertes.fr/hal-00180554
Contributor : Dominique Dallet <>
Submitted on : Friday, October 19, 2007 - 2:53:52 PM
Last modification on : Thursday, January 11, 2018 - 6:21:07 AM

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  • HAL Id : hal-00180554, version 1

Citation

Laurent Bechou, Dominique Dallet, Yves Danto, Pasquale Daponte, Yves Ousten, et al.. An improved method for automatic detection and location of defects in electronics components using scanning ultrasonic microscopy. IEEE Transactions on Instrumentation and Measurement, Institute of Electrical and Electronics Engineers, 2003, 52 (1), pp.135-142. ⟨hal-00180554⟩

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