Detection and location of defects in electronic devices by means of scanning ultrasonic microscopy and the wavelet Transform

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https://hal.archives-ouvertes.fr/hal-00180545
Contributor : Dominique Dallet <>
Submitted on : Friday, October 19, 2007 - 2:48:11 PM
Last modification on : Thursday, January 11, 2018 - 6:21:07 AM

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  • HAL Id : hal-00180545, version 1

Citation

Léopoldo Angrisani, Laurent Bechou, Dominique Dallet, Pasquale Daponte, Yves Ousten. Detection and location of defects in electronic devices by means of scanning ultrasonic microscopy and the wavelet Transform. Measurement, Elsevier, 2002, 31 (2), pp.77-91. ⟨hal-00180545⟩

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