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Detection and location of defects in electronic devices by means of scanning ultrasonic microscopy and the wavelet Transform

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https://hal.archives-ouvertes.fr/hal-00180545
Contributor : Dominique Dallet <>
Submitted on : Friday, October 19, 2007 - 2:48:11 PM
Last modification on : Thursday, December 19, 2019 - 11:12:04 AM

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  • HAL Id : hal-00180545, version 1

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Léopoldo Angrisani, Laurent Bechou, Dominique Dallet, Pasquale Daponte, Yves Ousten. Detection and location of defects in electronic devices by means of scanning ultrasonic microscopy and the wavelet Transform. Measurement - Journal of the International Measurement Confederation (IMEKO), Elsevier, 2002, 31 (2), pp.77-91. ⟨hal-00180545⟩

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