Jitter measurement of an ADC by statistical analysis

Abstract : A method for measuring the jitter of an ADC based on the 'lcked histogram' test is presented, and the conditions for validation of the test as a function of the sampling position is studied. As all test bench instruments have their own independent jitter a mathematical model is used to extract the jitter of the ADC. Some experimental results are given.
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Contributor : Dominique Dallet <>
Submitted on : Wednesday, October 17, 2007 - 7:48:42 AM
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  • HAL Id : hal-00179889, version 1

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Dominique Dallet, Philippe Marchegay, Mohamed Benkais. Jitter measurement of an ADC by statistical analysis. International Journal of Electronics, Taylor & Francis, 1994, 77 (4), pp.517-523. ⟨hal-00179889⟩

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