Multi-scale analysis of the dielectric properties and structure of resin/carbon-black nanocomposites

S. Paciornik O. Da Fonseca Martins Gomes Arnaud Delarue 1 Sylvie Schamm-Chardon 2 Dominique Jeulin 1 Alain Thorel 3
1 CMM - Centre de Morphologie Mathématique
2 CEMES - Centre d'élaboration de matériaux et d'études structurales
3 MAT - Centre des Matériaux
Abstract : Dielectric properties of resin/carbon-black nanocomposites were measured and shown to differ from results given by a random sets modeling approach. The origin of the discrepancies was traced back to the presence of sets of carbon planes, detached from the carbon-black particles during the composite preparation. These planes are dispersed in the resin matrix and are nearly invisible, even in HRTEM images. EELS measurements revealed the signature of bonding states typical of graphite-like compounds, in regions of the matrix previously supposed to be free of carbon-black. A new approach to texture characterization of HRTEM images, using Haralick parameters based on pixel intensity co-occurrence matrices, showed strong differences between pure resin and regions of the composite between carbon particles. The nano-scale characterization results explain the values obtained in macroscopic measurements.
Type de document :
Article dans une revue
European Physical Journal: Applied Physics, EDP Sciences, 2003, 21, pp.17-26. 〈10.1051/epjap:2002107〉
Liste complète des métadonnées
https://hal.archives-ouvertes.fr/hal-00166093
Contributeur : Bibliothèque Umr7633 <>
Soumis le : mardi 31 juillet 2007 - 17:05:45
Dernière modification le : mardi 13 novembre 2018 - 01:17:47

Lien texte intégral

istex

Identifiants

Collections

ENSMP_CMM | ENSMP | ENSMP_MAT | PARISTECH | INSTITUT-TELECOM | UNIV-TLSE3 | PSL | INSA-TOULOUSE | CEMES | MEM

Citation

S. Paciornik, O. Da Fonseca Martins Gomes, Arnaud Delarue, Sylvie Schamm-Chardon, Dominique Jeulin, et al.. Multi-scale analysis of the dielectric properties and structure of resin/carbon-black nanocomposites. European Physical Journal: Applied Physics, EDP Sciences, 2003, 21, pp.17-26. 〈10.1051/epjap:2002107〉. 〈hal-00166093〉

Exporter

BibTeX TEI DC DCterms EndNote

Partager

Métriques

Consultations de la notice

274

Contact

support.ccsd.cnrs.fr
hal.support@ccsd.cnrs.fr
Logo CCSD