Structure and composition of passive titanium oxide films
Résumé
The thickness and composition of several kinds of titanium oxide films formed on a titanium substrate were determined by surface analysis techniques: X-ray photoelectron spectroscopy, Rutherford back scattering, X-ray diffraction and atomic force microscopy. Most titanium oxide samples were prepared by anodisation, using a galvanostatic procedure. The films were shown to be composed of an amorphous TiO2 outer layer (10–20 nm thick) and an intermediate TiOx layer, in contact with the TiO2 layer and the metallic substrate. The outer layer is sensitive to the environment: its thickness usually decreases with ageing in a corrosive solution. A stabilisation procedure was proposed in order to improve its ability to withstand corrosion.