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Communication Dans Un Congrès Année : 2005

Porous silicon composite material for non linear optical properties: characterisation by spectroscopic ellipsometry and second harmonic generation

Résumé

Composite porous silica-DR1 films were obtained and have been analysed before and after poling by a static electric field. Spectroscopic ellipsometry was used to study the optical properties of layers of these composite material in the UV-IR spectral range (0.75-4.5 eV). Second harmonic generation was performed in the near-infrared spectral range. Preferential alignment of the dye molecules parallel to the pores perpendicular to the surface was shown by second harmonic generation experiments after the poling treatment. Increasing of the absorption and of the dichroïsm were also observed by spectroscopic ellipsometry analysis.

Dates et versions

hal-00154046 , version 1 (12-06-2007)

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Mohammed Guendouz, M. Ben Salah, Bernard Le Jeune, S. Rivet, Guy Le Brun, et al.. Porous silicon composite material for non linear optical properties: characterisation by spectroscopic ellipsometry and second harmonic generation. Porous Semiconductors - Science and Technology 4th international conference (PSST 2004), Mar 2004, Cullera-Valencia, Spain. pp.3370-3374, ⟨10.1002/pssc.200461171⟩. ⟨hal-00154046⟩
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