Non linear optical property of poly(phenylene vinylene) in porous silicon substrates

Thien-Phap Nguyen (1) , P. Le Rendu (1) , C. Simos (2) , P. X. Nguyen (2) , Vladimir Skarka (2) , M. de Kok (3) , K. Cheah , Mohammed Guendouz (4) , Pierre Joubert (4)

1 IMN - Institut des Matériaux Jean Rouxel
2 POMA - Propriétés Optiques des Matériaux et Applications
3 IMO - Institut for Material Research
4 FOTON - Fonctions Optiques pour les Technologies de l'informatiON

We present a new technique to fill porous silicon layers of 5 µm thick with poly(p phenylene vinylene) (PPV), a polymer having high nonlinear coefficient in view of preparing waveguide devices. By analyzing the samples with different optical techniques, we have demonstrated that this method was efficient in filling the substrate within the whole thickness of the porous layer. Furthermore, the nonlinear properties of the polymer was found to be enhanced, which is promising for the use of these structures as waveguides in integrated optic applications.

Domaines: Optique [physics.optics]

Thien-Phap Nguyen, P. Le Rendu, C. Simos, P. X. Nguyen, Vladimir Skarka, et al.. Non linear optical property of poly(phenylene vinylene) in porous silicon substrates. Porous Semiconductors - Science and Technology 4th international conference (PSST 2004), Mar 2004, Cullera-Valencia, Spain. pp.3222-3226, ⟨10.1002/pssc.200461123⟩. ⟨hal-00153792⟩