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Adhesive forces investigation on a silicon tip by contact mode atomic force microscope

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https://hal.archives-ouvertes.fr/hal-00148768
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Submitted on : Wednesday, May 23, 2007 - 10:44:38 AM
Last modification on : Wednesday, March 23, 2022 - 3:50:21 PM

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  • HAL Id : hal-00148768, version 1

Citation

V. Agache, Bernard Legrand, D. Collard, L. Buchaillot. Adhesive forces investigation on a silicon tip by contact mode atomic force microscope. Applied Physics Letters, American Institute of Physics, 2002, 81, pp.2623-2625. ⟨hal-00148768⟩

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