Skip to Main content Skip to Navigation
Conference papers

An original methodology to assess fatigue behavior in RF MEMS devices

Document type :
Conference papers
Complete list of metadata

https://hal.archives-ouvertes.fr/hal-00141031
Contributor : Collection Iemn Connect in order to contact the contributor
Submitted on : Wednesday, April 11, 2007 - 11:21:23 AM
Last modification on : Saturday, October 9, 2021 - 3:12:41 AM

Identifiers

  • HAL Id : hal-00141031, version 1

Citation

O. Millet, Pierre Bertrand, Bernard Legrand, D. Collard, L. Buchaillot. An original methodology to assess fatigue behavior in RF MEMS devices. European Microwave Week, 2004, Amsterdam, Netherlands. ⟨hal-00141031⟩

Share

Metrics

Record views

66