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Measurement of low Schottky barrier heights applied to metallic source/drain MOSFETs

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https://hal.archives-ouvertes.fr/hal-00140973
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Submitted on : Wednesday, April 11, 2007 - 10:30:54 AM
Last modification on : Saturday, October 9, 2021 - 3:11:16 AM

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  • HAL Id : hal-00140973, version 1

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E. Dubois, G. Larrieu. Measurement of low Schottky barrier heights applied to metallic source/drain MOSFETs. Journal of Applied Physics, American Institute of Physics, 2004, 96, pp.729-737. ⟨hal-00140973⟩

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