Recent advances in high resolution X-ray diffractometry applied to nanostructured oxide thin films : the case of yttria stabilized zirconia epitaxially grown on sapphire

Alexandre Boulle (1) , René Guinebretière (1) , A. Masson (2) , R. Bachelet (2) , Florine Conchon (2) , A. Dauger (2)

1 Axe 3 : organisation structurale multiéchelle des matériaux
2 SPCTS - Science des Procédés Céramiques et de Traitements de Surface

Alexandre Boulle, René Guinebretière, A. Masson, R. Bachelet, Florine Conchon, et al.. Recent advances in high resolution X-ray diffractometry applied to nanostructured oxide thin films : the case of yttria stabilized zirconia epitaxially grown on sapphire. Applied Surface Science, 2006, 253, pp.95-105. ⟨10.1016/j.apsusc.2006.05.086⟩. ⟨hal-00131940⟩